Accurate statistical process variation analysis for 0.25-μm CMOS with advanced TCAD methodology

An Accurate Timing Model for Nano CMOS Circuit Considering Statistical Process Variation

Process variation has more significant impact on circuit performance as technology develops to nano scale. It is therefore necessary to evaluate chip performance using statistical timing analysis rather than deterministic static timing analysis. This paper first evaluates the impact of single extrinsic fluctuation on circuit performance based on the rigorously derived propagation delay model. T...

Direct Sampling Methodology for Statistical Analysis of Scaled CMOS Technologies

The continued scaling of CMOS technologies introduces new difficulties to statistical circuit analysis and invalidates many of the methodologies developed earlier. The analysis of device parameter distributions reveals multiple sources of parameter correlations, some of which exhibit mutually opposing trends. We found that applying principal component analysis (PCA) to such heterogeneous statis...

Design of a K-band Low Insertion Loss Variation Phase Shifter Using 0.18-μm CMOS Process

This paper demonstrates a k-band low insertion loss variation phase shifter with over 330∘continuously phase tuning range from 21-25GHz in standard 0.18-μm CMOS technology. This phase shifter is composed of a 180 ∘ continuously phase tuning range reflection type phase shifter (RTPS) and a 180∘discrete switch type phase shifter (STPS). The measured phase shift range is 336∘with low loss variatio...

Uncalibrated Tcad Methodology for Analysis of Esd Protection Devices By

An Effective Methodology for Predicting the Distribution of MOSFET Device Characteristics Using Statistical TCAD Simulations

We have developed a novel and effective method for predicting the distribution of MOSFET device characteristics, which also enables us to specify the most typical process conditions for any device characteristics. In our approach, the distribution of the device characteristic caused by the fluctuation of every single process are calculated and then merged. Comparison with the result of the meas...